Design, fabrication, iteration, and testing of the 68x68 superlattice LED infrared projection system and associated electronics
Date
2010
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Publisher
University of Delaware
Abstract
Optoelectronic devices that emit in the mid-wave infrared (MWIR) and long-wave infrared (LWIR) wavelengths have traditionally targeted the 3-4 and 8-12 micrometer wavelength, because atmospheric absorption is minimal in the these windows. Infrared (IR) radiation has long been of scientific interest because the unique signatures of light emitted or absorbed can be remotely detected and characterized
for all manner of objects and processes. Large IR detector arrays, particularly ones intended for military and/or aerospace applications, are often difficult and expensive to directly test. Ultimately for these detectors, an IR projector for scene simulation is required. This thesis documents the creation and testing of a cryogenic integrated infrared projection system combining large two-dimensional arrays of superlattice light-emitting diodes (SLEDs) with a custom driver IC and FPGA-based control system. It covers a range of disciplines, design decisions, systems engineering issues, and personal observations on the process of the design, fabrication, iteration, and testing of the 68x68 SLEDs system. Several testing sessions showed the unique functionality and capabilities in several important areas such as: apparent temperature exceeding 1000 Kelvin, rise and fall time of a few microseconds, and over 90 percent functional yield. The work described in this paper provides the foundation for the 512x512 SLEDs system currently in development.