Defects as qubits in 3C- and 4H-SiC

Author(s)Gordon, L.
Author(s)Janotti, Anderson
Author(s)Van de Walle, Chris G.
Ordered AuthorL. Gordon, A. Janotti, and C. G. Van de Walle
UD AuthorJanotti, Andersonen_US
Date Accessioned2016-06-22T19:54:19Z
Date Available2016-06-22T19:54:19Z
Copyright DateCopyright ©2015 American Physical Societyen_US
Publication Date2015-07-20
DescriptionPublisher's PDFen_US
AbstractWe employ hybrid density functional calculations to search for defects in different polytypes of SiC that may serve as qubits for quantum computing. We explore the divacancy in 4H- and 3C-SiC, consisting of a carbon vacancy adjacent to a silicon vacancy, and the nitrogen-vacancy (NV) center in 3C-SiC, in which the substitutional NC sits next to a Si vacancy (NC-VSi). The calculated excitation and emission energies of the divacancy in 4H-SiC are in excellent agreement with experimental data, and aid in identifying the four unique configurations of the divacancy with the four distinct zero-phonon lines observed experimentally. For 3C-SiC, we identify the paramagnetic defect that was recently shown to maintain a coherent quantum state up to room temperature as the spin-1 neutral divacancy. Finally, we show that the (NC-VSi)− center in 3C-SiC is highly promising for quantum information science, and we provide guidance for identifying this defect.en_US
DepartmentUniversity of Delaware. Department of Materials Science and Engineering.en_US
CitationGordon, L., A. Janotti, and C. G. Van de Walle. "Defects as qubits in 3 C− and 4 H− SiC." Physical Review B 92.4 (2015): 045208.en_US
DOI10.1103/PhysRevB.92.045208en_US
ISSN2469-9950 ; e- 2469-9969en_US
URLhttp://udspace.udel.edu/handle/19716/17811
Languageen_USen_US
PublisherAmerican Physical Societyen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourcePHYSICAL REVIEW Ben_US
dc.source.urihttp://journals.aps.org/prb/en_US
TitleDefects as qubits in 3C- and 4H-SiCen_US
TypeArticleen_US
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